Beijing, 23rd July 2018 (BISTU)— The 7th International Symposium on Test Automation and Instrumentation (ISTAI’ 2018), co-sponsored by BISTU and China Instrument and Control Society, successfully completes in Dalian of China. The Symposium gathers over 220 delegates from universities and research institutes home and abroad. It is hosted by Ministry of Education Key Lab of Modern Test and Control Technology at BISTU, Measurement and Instrumentation Branch of China Instrument and Control Society, and Municipal Key Lab of Electromechanical Test and Control. It is also supported by a number of institutions including Institution of Engineering and Technology (IET), Dalian Jiaotong University, Chinese Journal of Scientific Instrument, Journal of Electronic Measurement and Instrumentation, and Electronic Measurement Technology.
President Wang Yongsheng of BISTU, honorary Chairman of the Symposium, extends warmest congratulations in his address to the opening ceremony hosted by Vice President Xu Baojie, Chairman of the Symposium. Executive Chairman of the Symposium is Director Xu Xiaoli of Ministry of Education Key Lab of Modern Test and Control Technology at BISTU. Also the Symposium welcomes Vice President Wu Peng of China Instrument and Control Society.
The symposium is a big event in the field of instrumentation and measurement. Themed on “New Development of Test and Control Technology with Smart Help”, the Symposium offers opportunities for researchers and engineers to communicate and exchange and builds a platform for display of up-to-date research achievements in this field home and abroad. Keynote speeches are delivered by experts from China, America, the UK, Australia and Ireland. Three branch conferences are respectively hosted by BISTU faculties on measurement control technology and smart instruments, robotics and smart technology, access to information and information procession, telecommunication and application of microwave. Altogether 36 experts and scholars from Chinese Academy of Sciences, Beihang University, Shanghai University, Wuhan University, Xiamen University, China University of Petroleum, University of Electronic Science and Technology of China, and BISTU attends the seminars where 124 papers are displayed. Collection of papers will be published with EI index by The Institution of Engineering and Technology.